ASIA unversity:Item 310904400/101469
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    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/101469


    Title: Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
    Authors: Perng；, 劉曉薇；Hsiao-Wei Liu；陳思翰；Ssu-Han Chen；*；彭德保；Der-Baau
    Contributors: 經營管理學系
    Date: 2016-05
    Issue Date: 2016-09-20 11:44:30 (UTC+8)
    Relation: IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
    Appears in Collections:[Department of Accounting and Information Systems] Journal Article

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