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    ASIA unversity > 資訊學院 > 資訊工程學系 > 期刊論文 >  Item 310904400/2147


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/2147


    Title: A pattern deformational model and Bayes error-correcting recognition system
    Authors: TSAI, W-H
    FU, K-S
    Contributors: Asia University
    Date: 1979-12
    Issue Date: 2009-10-23 14:29:21 (UTC+8)
    Abstract: A pattern deformational model is proposed in this paper. Pattern deformations are categorized into two types: local deformation and structural deformation. A structure-preserving local deformation can be decomposed into a syntactic deformation followed by a semantic deformation, the former being induced on primitive structures and the latter on primitive properties. Bayes error-correcting parsing algorithms are proposed accordingly which not only can perform normal syntax analysis but also can make statistical decisions. An optimum Bayes error-correcting recognition system is then formulated for pattern classification. The system can be considered as a hybrid pattern classifier which uses both syntactic and statistical pattern recognition techniques.
    Relation: IEEE Transactions on Systems, Man, and Cybernetics SMC-9:745-756
    Appears in Collections:[資訊工程學系] 期刊論文

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