English  |  正體中文  |  简体中文  |  Items with full text/Total items : 90453/105672 (86%)
Visitors : 13151851      Online Users : 614
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    ASIA unversity > 管理學院 > 經營管理學系  > 期刊論文 >  Item 310904400/25323

    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/25323

    Title: A new process capability analysis chart approach on the chip resistor quality management
    Authors: 歐陽良裕;Ouyang, Liang-Yuh;許昌賢;Hsu, Chang-Hsien;楊俊明;Yang, Chun-Ming
    Contributors: 經營管理學系
    Keywords: Accuracy;discrimination distance;precision;process capability analysis chart;process capability indices
    Date: 2013
    Issue Date: 2013-07-11 14:16:02 (UTC+8)
    Abstract: Process capability indices have been extensively used to determine whether the quality characteristics of the product meet the preset targets of the customer in manufacturing industries. However, these existing process capability indices cannot categorically determine improvement priorities for substandard quality characteristics. Besides, process capability indices also cannot effectively identify and measure deficiencies in process capability owing to accuracy, precision, or both. In this study, we combine the process capability index Cpm, minimum individual process capability C0, accuracy A, and precision P to develop a new process capability analysis chart. Managers can apply process capability analysis chart to identify the substandard quality characteristics of the product. Furthermore, if the budget for all substandard quality characteristics improvements is limited, we use the discrimination distance method to measure and determine improvement priorities for substandard quality characteristics. Moreover, we construct an implementation flowchart of the process capability analysis chart to derive the results easily. Finally, an example of a chip resistor is presented to illustrate the applicability of the process capability analysis chart for manufacturing quality management.
    Relation: Proceedings Of The Institution Of Mechanical Engineers Part B-Journal Of Engineering Manufacture
    Appears in Collections:[經營管理學系 ] 期刊論文

    Files in This Item:

    File SizeFormat

    All items in ASIAIR are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback