English  |  正體中文  |  简体中文  |  Items with full text/Total items : 92958/108462 (86%)
Visitors : 20453395      Online Users : 258
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/4757


    Title: A novel manufacturing defect detection method using association rule mining techniques
    Authors: W. C. Chen;S. S. Tseng;C. Y. Wang
    Contributors: Department of Information Science and Applications
    Keywords: Association rule mining;Defect detection;Interestingness measurement;Manufacturing defect detection problem
    Date: 2005-11
    Issue Date: 2009-11-30 16:03:26 (UTC+8)
    Publisher: Asia University
    Abstract: In recent years, manufacturing processes have become more and more complex, and meeting high-yield target expectations and quickly identifying root-cause machinesets, the most likely sources of defective products, also become essential issues. In this paper, we first define the root-cause machineset identification problem of analyzing correlations between combinations of machines and the defective products. We then propose the Root-cause Machine Identifier (RMI) method using the technique of association rule mining to solve the problem efficiently and effectively. The experimental results of real datasets show that the actual root-cause machinesets are almost ranked in the top 10 by the proposed RMI method.
    Relation: Expert Systems with Applications 29(4):379-390
    Appears in Collections:[行動商務與多媒體應用學系] 期刊論文

    Files in This Item:

    File Description SizeFormat
    0KbUnknown786View/Open
    310904400-4757.doc38KbMicrosoft Word372View/Open


    All items in ASIAIR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback