English  |  正體中文  |  简体中文  |  Items with full text/Total items : 90069/105176 (86%)
Visitors : 5785702      Online Users : 533
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    ASIA unversity > 資訊學院 > 資訊工程學系 > 期刊論文 >  Item 310904400/64278


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/64278


    Title: A high-resolution technique for flicker measurement in power quality monitoring
    Authors: 陳正一;Chen, Cheng-I.;陳永欽;CHEN, YEONG-CHIN;陳兆南;CHEN, CHAO-NAN
    Contributors: 資訊工程學系
    Keywords: flicker;power quality;high-resolution technique;fundamental frequency deviation;flickermeter
    Date: 201306
    Issue Date: 2013-10-29 11:07:52 (UTC+8)
    Abstract: Flicker is one of significant power quality disturbances, which may lead to serious voltage fluctuation. Therefore, the accurate estimation of flicker components plays
    an important role in the power quality monitoring and protection of power system. In this paper, a high-resolution technique is proposed to extract the flicker components effectively. Different from the conventional spectral analysis methods, the performance of proposed mechanism would not be influenced by the fundamental frequency deviation, the sampling frequency, and the length of sampled data. With the experimental test, the estimation accuracy and robustness are verified.
    Relation: Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, pp.528-533
    Appears in Collections:[資訊工程學系] 期刊論文

    Files in This Item:

    File SizeFormat
    index.html0KbHTML105View/Open


    All items in ASIAIR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback