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    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/65340

    Title: Backlit Keyboard Inspection Using Machine Vision
    Authors: Perng, Der-Baau;Liul, Hsiao-Wei;Chen, Po-An
    Contributors: 資訊多媒體應用學系
    Keywords: backlit keyboard, illumination defect inspection, uniformity
    Date: 2013-12
    Issue Date: 2013-12-18 10:45:43 (UTC+8)
    Abstract: A robust system for backlit keyboard inspection is revealed. The backlit keyboard not only has changeable diverse color but also has the laser marking keys. The keys on the keyboard can be divided into regions of function keys, normal key, and number keys. However, there might have some types of defects: incorrect illuminating area, non-niform illumination of specified inspection region (IR), and incorrect luminance and intensity of individual key. Since the illumination features of backlit keyboard are too complex to inspect for human inspector in the production line, an automated inspection system for backlit keyboard was proposed. The system was designed into operation module and inspection module. A set of image processing methods were developed for these defects inspection. Some experimental results were given to demonstrate the robustness and effectiveness of the proposed system.
    Relation: 2013全國計算機會議
    Appears in Collections:[行動商務與多媒體應用學系] 會議論文

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