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    ASIA unversity > 資訊學院 > 資訊工程學系 > 期刊論文 >  Item 310904400/96007


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/96007


    Title: Improvement of On-Resistance Degradation Induced by Hot Carrier Injection in SOI-LDMOS
    Authors: Ningaraju), Vivek Ningar(Vivek;Yang)*, 楊紹明(Shao-Ming;Sheu), 許健(Gene;Amanullah), Md.Amanullah(Md.;Kurniawan), Erry Dwi Kur(Erry Dwi;Subramanyaj(Subramanyaj)
    Contributors: 資訊工程學系
    Date: 2015-04
    Issue Date: 2015-12-11 13:48:35 (UTC+8)
    Relation: Applied Mechanics and Materials
    Appears in Collections:[資訊工程學系] 期刊論文

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